“Exploring the latest Advanced Process Control advancements
in the microelectronics manufacturing industries”
Click here to order the 2014 and/or 2015 APC Conference Proceedings
Registration is open, click here to register
First Call For Papers
As manufacturing processes
become more complex with greater yield and cost objectives, the methods
to increase productivity and quality become vital. Semiconductor,
photovoltaic, display, MEMS, LED, and other industries are experiencing
unparalleled cost/quality pressures. Cost/quality objectives have made
Advanced Process Control (APC) absolutely critical for profitable
manufacturing. The Integrated Measurement Association is pleased to
again host this year’s conference and announce the APC Conference XXVIII
Call for Papers.
This call for papers is directed to Integrated Circuit and related industries. Manufacturers, equipment suppliers, software solution providers, sensor, and metrology suppliers are all welcome to submit abstracts. Advancements in related industries, such as solar devices, flat panels, LEDs and MEMs, will also be discussed in order to assess how synergy between these industries can be better leveraged. The conference will focus on recent technical advancements, current challenges, and future needs and trends
The conference will be built around topics such as, but not limited to:
Prospective authors must submit abstracts by email. Abstracts should consist of two pages. Page one is for text (max 1,000 words); page two is for figures, data, and charts. Only MS Word and PDF files are acceptable. Abstracts must be in English. Tables and graphics must be embedded in the file. Email abstracts as an attachment to Info@APCconference.com. Abstracts are used to determine which will be accepted for oral/poster presentation. Accepted authors must submit a PowerPoint presentation. Authors submitting presentations are encouraged to also submit a 3-6 page extended abstract. The presentation and abstract or extended abstract will be included in the proceedings. A downloadable abstract template is on the conference website.
Abstract Submission Deadline: July 15, 2016
Abstract Acceptance Notification: August 12, 2016
PowerPoint Presentation File
Extended Abstract Deadline: September 30, 2016
The APC Conference is co-chaired by:
Dr. James Moyne, University of Michigan, Applied Materials
John Pace, Integrated Measurement Association, President
Dr. Bradley Van Eck, Integrated Measurement Association, VP
The APC Conference is Underwritten and Organized by the Integrated Measurement Association (IMA)
Advanced Process Control Conference 2016
Monday, October 17, 2016 - Thursday, October 20, 2016 8:00 AM - 8:00 PMCentral Time
Hilton Phoenix/Mesa Hotel1011 W Holmes AveMesa, Arizona 85210USA1-480-833-5555
The Integrated Measurement Association (IMA) underwrites the APC Conference.
We can be reached for customer service by email or telephone.
Email: Info@APCconference.com Telephone: 1-203-329-0057
If you would like additional information about the APC Conference or if you would like to be added to our distribution list please drop us an email at Info@APCconference.com.
Cvent Online Event Registration Software | Copyright © 2000-2016 Cvent, Inc. All rights reserved.