APC Conference XXXI 2019

Announcements

The 2019 tutorials have not been finalized.  Tutorials will be held on Monday, October 28, 2019.  Check this website in May for updates.

Gold Sponsors

Call For Papers
As manufacturing processes become more complex with greater yield, quality and cost objectives, APC methods to maximize productivity and quality become an increasingly important component of Smart Manufacturing solutions. These APC methods include traditional capabilities of diagnostics and process control, but also include emerging smart manufacturing / Industry 4.0 capabilities such as prediction technologies and the “digital twin”, Industrial Internet of Things (IIoT), supply chain optimization and big data solutions. Semiconductor, memory, photovoltaic, display, MEMS, LED, pharmaceuticals, chemical and other industries are experiencing unparalleled cost and quality pressures. These demanding objectives have made APC enabled smart manufacturing absolutely critical for profitable manufacturing. The Integrated Measurement Association is pleased announce the APC Conference 2019 Call for Papers. This call for papers is directed to the microelectronics industry, but also to any discrete manufacturing industry that has similar requirements of productivity, quality and precision. Manufacturers, equipment suppliers, universities, research institutions, software providers, sensor, and metrology suppliers are all encouraged to submit abstracts. The conference will focus on technical advancements, current challenges, synergy between industries especially up and down the supply chain, and future needs and trends. Suggested topics for submitted abstracts and the abstract submission procedure are described below.

Conference Topics
The conference will be built around topics such as, but not limited to:

• Run-to-run, wafer-to-wafer, model-based, and real-time process control
• Fault detection and classification (FDC), and fault prediction (FP)
• Predictive maintenance, predictive scheduling, predictive yield
• Virtual metrology, sensing and integrated metrology
• Simulation, emulation, and cyber-physical systems
• Big data analytics, data mining, Hadoop, and cloud-based systems
• Data collection and management, data quality
• Security such as in data sharing, partitioning and IP, conversion techniques, standards
• Analytics, analytics application, and digital thread
• Factory-wide and enterprise-wide applications and deployment
• Manufacturing Execution Systems (MESs) and their integration with APC
• Integration with yield, maintenance management, adaptive scheduling, DFM
• Sensor development, implementation, integration, remote/wireless networks
• Applications: Etch, litho, dep., implant, backend, solar, MEMS, PV, disk drive, pharma
• Future needs, requirements, roadmaps, Industry 4.0 and smart manufacturing
• Equipment productivity data collection/analysis
• APC-related solutions in other precision industries such as pharmaceutical and chemical
• APC and green technologies, environmental safety and health

Abstract Submission Rules and Procedures

• By submitting an abstract you agree to be bound by the following rules and procedures.
• Submissions should consist of an informational page (title, authors, email), one or more pages for abstract text (motivation, approach, results), and one or more pages for figures, charts, data tables, and/or pictures.
• Abstracts must include a description of the Motivation for the work, a description of the Approach used, and a description of the Results. Abstracts and presentations must be technical in nature. Abstracts that are simple product descriptions or are commercially focused will be rejected. Abstracts marked confidential or proprietary will be rejected.
• Only MS Word and PDF file formats are acceptable. A link to the downloadable abstract submission form is below on this conference website.
• Abstracts must be in English. Text, tables and graphics must be embedded into a single file.
• Email your abstract to vaneck@APCconference.com
• Abstracts are used to determine which submissions will be accepted for oral or poster presentation. Accepted authors will be contacted by email
• All accepted abstract authors must submit both a PowerPoint file and a PDF file of their poster or oral presentation.
• Presenting authors (oral and poster) must register online for the APC Conference.
• The PowerPoint file will be used during oral presentation at the conference.
• The PDF version of the presentation (oral and poster) will be included in the conference proceedings.
• A suggested PowerPoint Poster template and an oral presentation PPT template, in 16:9 aspect ratio, are available for download, see links below.

Direct questions/inquiries to vaneck@APCconference.com.

Download Abstract Submission Form

Download Poster PPT Template

Download Presentation Template 16:9 Format

Download Call for Papers Document

Download Blank Publication Permission Form

Important Dates

Abstract Submission Deadline: July 26, 2019

Abstract Acceptance Notification: August 30, 2019

PowerPoint Presentation/Poster and PDF Deadline: October 4, 2019

Group Discounts
If your company anticipates sending 6 or more people to the APC Conference, send an email to vaneck@APCconference.com.  The IMA will consider group discounts. Click to send an email to the APC Conference organizers vaneck@apcconference.com

CONFERENCE ORGANIZATION

The APC Conference is co-chaired by:

Dr. James Moyne, University of Michigan, Applied Materials

John Pace, Integrated Measurement Association, President

Dr. Bradley Van Eck, Integrated Measurement Association, VP

The APC Conference is Underwritten and Organized by the Integrated Measurement Association