Announcements
AM TUTORIAL: Machine Learning, Deep Learning – Artificial Intelligence for the Semiconductor Industry Instructor: Jim Redman, ErgoTech
Tuesday Keynote: Chris Maloney (Intel)
Advanced Process Control (APC) Systems are becoming increasingly critical in semiconductor manufacturing and the ongoing pursuit of Moore’s Law. As dimensions get smaller with each technology node, the tolerance for variability also decreases. Process targets are tight, and the tools are operating on the edge of their capability. When the process tools are not able to achieve the process targets on their own, we turn to APC to compensate for incoming variability, environmental changes, and process shifts. APC has become so integral to semiconductor manufacturing that when the APC systems go down, the fab goes down. The APC system is extremely dynamic and responsive, responding and adjusting to every variation in real time. Any interruption in that flow can have catastrophic consequences to the current operation and every downstream operation. In this talk we will cover how APC grew from a niche solution to an integral and pervasive part of semiconductor manufacturing during technology development as well as high volume manufacturing, and we will look at the challenges and opportunities for APC in future technology nodes.
Wednesday Keynote: Joe Ervin (Lam Research/Coventor)
Joseph Ervin is director of the Semiconductor Process and Integration group at Coventor, where he is responsible for managing engineers who support customers of Coventor’s Virtual Fabrication platform. Previously, he worked for IBM on semiconductor device and integration development at multiple research and foundry locations, including ST Microelectronics, the College of Nanoscale Science and Engineering, and at GlobalFoundries. His current position includes work with next node semiconductor integration challenges, along with unique methods for modeling and solving these issues. He holds a Ph.D. in Device Physics from Arizona State University.
Call For Papers As manufacturing processes become more complex with greater yield, quality and cost objectives, APC methods to increase productivity and quality become vital. These APC methods include traditional capabilities of diagnostics and process control, but also include emerging capabilities associated with the move to implement smart manufacturing and Industry 4.0 concepts; these extended APC capabilities include prediction technologies simulation and “digital twin”, and big data infrastructures. Semiconductor, memory, photovoltaic, display, MEMS, LED, pharmaceuticals, chemical and other industries are experiencing unparalleled cost and quality pressures. These demanding objectives have made APC absolutely critical for profitable manufacturing. The Integrated Measurement Association is pleased to again host this year’s conference and announce the APC Conference XXX Call for Papers.
This call for papers is directed to the microelectronics industry, but also to any discrete manufacturing industry that has similar requirements of productivity, quality and precision. Manufacturers, equipment suppliers, universities and research institutions, software solution providers, sensor, and metrology suppliers are all encouraged to submit abstracts. APC advancements in the semiconductor and related industries will be examined to assess how synergy between these industries can be better leveraged. The conference will focus on recent technical advancements, current challenges, and future needs and trends.
Conference Topics The conference will be built around topics such as, but not limited to:
Abstract Submission Rules and Procedures: By submitting an abstract you agree to be bound by the following rules and procedures:
Direct questions/inquiries to vaneck@APCconference.com.
Download Abstract Submission Form
Download Poster PPT Template
Download Presentation Template 16:9 Format
Download Call for Papers Document
Download Blank Publication Permission Form
Important Dates
Abstract Submission Deadline: August 10, 2018
Abstract Acceptance Notification: August 17, 2018
PowerPoint Presentation/Poster and PDF Deadline: September 14, 2018
Group DiscountsIf your company anticipates sending 6 or more people to the APC Conference, send an email to vaneck@APCconference.com. The IMA will consider group discounts. Click to send an email to the APC Conference organizers vaneck@apcconference.com
CONFERENCE ORGANIZATION
The APC Conference is co-chaired by:
Dr. James Moyne, University of Michigan, Applied Materials
John Pace, Integrated Measurement Association, President
Dr. Bradley Van Eck, Integrated Measurement Association, VP
The APC Conference is Underwritten and Organized by the Integrated Measurement Association
Related APC Links APC Europehttp://www.apcm-europe.eu/home.html APC Asia - Taiwanhttp://www.tsia.org.tw/seminar/eManufacturing2018/
APC Asia - Japanhttps://www.semiconportal.com/AECAPC/index_e.html
Abbot Point of Care
IBM
Samsung
ancosys
Independants
Samsung Display
Applied Materials
INFICON
Savigent Software
ASML
Integrated Measurement Association
SC Solutions
Baird & Associates
Intel
Seagate Technology
BISTel
KLA-Tencor
SEMI
Bosch Rexroth
Lam Research
SK Hynix
Brookside Software
LG CNS
Stream Mosaic
camLine
LG Display
Taiwan Semiconductor Manufacturing
Canon Nanotechnologies
Maxim Integrated
TEL Epion
Cimetrix
Mentor Graphics
TEL NEXX
Compugenesis
Nanochip Fab Solutions
Tokyo Electron
Cymer
National Fusion Research Institute
Toshiba
Cypress
New Iron Group
University of Cincinnati
Dow Chemical
Nova Measuring Instruments
University of Michigan
DR YIELD software & solutions
NXP Semiconductors
Veeco Precision Surface Processing
Ecole des Mines de Saint-Etienne
ON Semiconductor
Verity Instruments
Edwards Vacuum
Panasonic Energy of North America
Western Digital
ErgoTech Systems
PEER Group
Westerwood Global Limited
Georgia Institute of Technology
Qorvo
ZEISS
GLOBALFOUNDRIES
Rudolph Technologies
Keynote Address: Boyd Finlay, GLOBALFOUNDRIES “Raising the Bar: Foundry Expectations for Equipment Capability and Control“
Keynote Address:
Howard Witham, Qorvo (Triquint)
"Are Big Data, Analytics, and Artificial Intelligence Being Applied in Semiconductor Manufacturing?"
Ernest Adams, Cypress Semiconductor
"Legacy Factory Challenges"
Advanced Process Control Conference 2018
Monday, October 8, 2018 - Thursday, October 11, 2018 8:00 AM - 5:00 PMCentral Time
Hilton Austin Airport9515 Hotel DriveAustin, Texas 787191-512-385-6767
The Integrated Measurement Association (IMA) underwrites the APC Conference. We can be reached for customer service by email or telephone. Email: vaneck@APCconference.com Telephone: 1-203-329-0057 If you would like additional information about the APC Conference or if you would like to be added to our distribution list please drop us an email at vaneck@APCconference.com.