Summary

The Advanced Process Control Conference (APC) will address APC needs and solutions for the semiconductor and related industries that also require high precision manufacturing. The conference is built around tutorials, technical presentations, poster sessions, and exhibits. The Integrated Measurement Association (IMA) underwrites and organizes this event. This year will be the 31st annual meeting of this conference.

Call for Papers

As manufacturing processes become more complex with greater yield, quality and cost objectives, APC methods to increase productivity and quality become vital. These APC methods include traditional capabilities of diagnostics and process control, but also include emerging capabilities associated with the move to implement smart manufacturing and Industry 4.0 concepts; these extended APC capabilities include prediction technologies simulation and “digital twin”, and big data infrastructures. Semiconductor, memory, photovoltaic, display, MEMS, LED, pharmaceuticals, chemical and other industries are experiencing unparalleled cost and quality pressures. These demanding objectives have made APC absolutely critical for profitable manufacturing. The Integrated Measurement Association is pleased to again host this year’s conference and announce the APC Conference XXXI Call for Papers.

This call for papers is directed to the microelectronics industry, but also to any discrete manufacturing industry that has similar requirements of productivity, quality and precision. Manufacturers, equipment suppliers, universities and research institutions, software solution providers, sensor, and metrology suppliers are all encouraged to submit abstracts. APC advancements in the semiconductor and related industries will be examined to assess how synergy between these industries can be better leveraged. The conference will focus on recent technical advancements, current challenges, and future needs and trends. Suggested topics for submitted abstracts and the abstract submission procedure are given below.

The APC conference will be built around topics such as, but not limited to:

• Run-to-run, wafer-to-wafer, model-based, and real-time process control
• Fault detection and classification (FDC), and fault prediction (FP)
• Predictive maintenance, predictive scheduling, predictive yield
• Virtual metrology, sensing and integrated metrology
• Simulation, emulation, and cyber-physical systems
• Big data analytics, data mining, Hadoop, and cloud-based systems
• Data collection and management, data quality
• Security such as in data sharing, partitioning and IP, conversion techniques, standards
• Analytics, analytics application, and digital thread
• Factory-wide and enterprise-wide applications and deployment
• Manufacturing Execution Systems (MESs) and their integration with APC
• Integration with yield, maintenance management, adaptive scheduling, DFM
• Sensor development, implementation, integration, remote/wireless networks
• Applications: Etch, litho, dep., implant, backend, solar, MEMS, PV, disk drive, pharma
• Future needs, requirements, roadmaps, Industry 4.0 and smart manufacturing
• Equipment productivity data collection/analysis
• APC-related solutions in other precision industries such as pharmaceutical and chemical
• APC and green technologies, environmental safety and health

Abstract Submission Rules and Procedures:

• By submitting an abstract you agree to be bound by the following rules and procedures.
• Submissions should consist of an informational page (title, authors, email), one or more pages for abstract text (motivation, approach, results), and one or more pages for figures, charts, data tables, and/or pictures.
• Abstracts must include a description of the Motivation for the work, a description of the Approach used, and a description of the Results. Abstracts and presentations must be technical in nature. Abstracts that are simple product descriptions or are commercially focused will be rejected. Abstracts marked confidential or proprietary will be rejected.
• Only MS Word and PDF file formats are acceptable. A link to the downloadable abstract submission form is below on this conference website.
• Abstracts must be in English. Text, tables and graphics must be embedded into a single file.
• Email your abstract to vaneck@APCconference.com
• Abstracts are used to determine which submissions will be accepted for oral or poster presentation. Accepted authors will be contacted by email
• All accepted abstract authors must submit both a PowerPoint file and a PDF file of their poster or oral presentation.
• Presenting authors (oral and poster) must register online for the APC Conference.
• The PowerPoint file will be used during oral presentation at the conference.
• The PDF version of the presentation (oral and poster) will be included in the conference proceedings.
• A suggested PowerPoint Poster template and an oral presentation PPT template, in 16:9 aspect ratio, are available for download, see links below.

Direct questions and/or inquiries to vaneck@APCconference.com

Download Abstract Submission Form

Download Poster PPT Template

Download Presentation PPT Template in 16:9 Aspect Ratio

Download Call for Papers Document

Download Publication Permission Form