The APC Conference is underwritten and organized by the Integrated Measurement Association www.APCconference.com
Keynote Address
"Automotive Semiconductor ZERO DEFECT Enablement" Steve Frezon Senior Vice President, Front End Operation, NXP Semiconductors
830 AM Tuesday, October 29, 2019
"SMART Tools: Intelligent Controls in Semiconductor Manufacturing"
Dr. Ben Rathsack Vice President and Deputy General Manager of the Development and Production Division, Tokyo Electron America
REGISTER NOW! - Early conference registration discount ends on Friday, September 27.
- Early Embassy Suites hotel room discount ends on Friday, September 27.
Tutorials are on Monday, October 28, 2019.Morning Tutorial: Introduction to and Application of Advanced Process Control Christopher Bode, INFICON Afternoon Tutorial: Learning to Share: Securing data access in a paranoid industry Douglas Suerich, PEER Group
Registration fees are the same as 2018. See the "FEES" tab.
The Call for Papers is now available. The abstract selection process for 2019 is complete and is now closed.
Summary Description of the APC Conference
The Advanced Process Control Conference (APC) will address APC smart manufacturing needs & solutions for the microelectronics and related industries that also require high precision manufacturing. The conference is built around tutorials, technical presentations, poster sessions, and exhibits. The Integrated Measurement Association (IMA) underwrites this event. This is the 31st annual conference.
If your company anticipates sending 6 or more people to the APC Conference, send an email to vaneck@APCconference.com. The IMA will consider group discounts. Click to send an email to the APC Conference organizers vaneck@apcconference.com
For a copy of specific abstracts and presentations from previous APC Conferences (2001 - 2018) please send an e-mail with the citation to vaneck@APCconference.com. Note that not all abstracts and presentations are available and terms and conditions may apply. Click here for additional information.
Dr. James Moyne, University of Michigan, Applied Materials
John Pace, Integrated Measurement Association, President
Dr. Bradley Van Eck, Integrated Measurement Association, VP
APC Europe
APC Asia - Taiwan
APC Asia - Japan
IRDS Events page
Abbot Point of Care
IBM
Samsung
ancosys
Independants
Samsung Display
Applied Materials
INFICON
Savigent Software
ASML
Integrated Measurement Association
SC Solutions
Baird & Associates
Intel
Seagate Technology
BISTel
KLA-Tencor
SEMI
Bosch Rexroth
Lam Research
SK Hynix
Brookside Software
LG CNS
Stream Mosaic
camLine
LG Display
Taiwan Semiconductor Manufacturing
Canon Nanotechnologies
Maxim Integrated
TEL Epion
Cimetrix
Mentor Graphics
TEL NEXX
Compugenesis
Nanochip Fab Solutions
Tokyo Electron
Cymer
National Fusion Research Institute
Toshiba
Cypress
New Iron Group
University of Cincinnati
Dow Chemical
Nova Measuring Instruments
University of Michigan
DR YIELD software & solutions
NXP Semiconductors
Veeco Precision Surface Processing
Ecole des Mines de Saint-Etienne
ON Semiconductor
Verity Instruments
Edwards Vacuum
Panasonic Energy of North America
Western Digital
ErgoTech Systems
PEER Group
Westerwood Global Limited
Georgia Institute of Technology
Qorvo
ZEISS
GLOBALFOUNDRIES
Rudolph Technologies
Monday, October 28, 2019 - Thursday, October 31, 2019 8:00 AM - 5:00 PMCentral Time
Embassy Suites Riverwalk125 E. Houston StreetSan Antonio, Texas 782051-210-226-9000
Bradley Van Eck